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Scanning Probe Microscopes

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Mad City Labs Inc. - Madison, WI

Designs and manufactures piezo nanopositioning systems and nanoscale precision instruments for metrology, photonics, astronomy, and microscopy. Closed loop nanopositioners with low noise, high stability PicoQ sensors. Products include piezo nanopositioners, single molecule microscopes, high precision micropositioning, AFM, and custom design.

Stock Manufacturer

Advanced Surface Microscopy Inc. - Indianapolis, IN

Glossary

scanning probe microscope See atomic force microscope; magnetic force microscope; near-field scanning optical microscope; scanning tunneling microscope.
atomic force microscope An atomic force microscope (AFM) is a high-resolution imaging and measurement instrument used in nanotechnology, materials science, and biology. It is a type of scanning probe microscope that operates by scanning a sharp tip (usually a few...
magnetic force microscope A variation of the atomic force microscope that operates by scanning a tiny ferromagnetic probe (or a magnetized tip) over a magnetic sample, and detecting the extremely small forces exerted on the probe by the sample's stray magnetic fields. The...
near-field scanning optical microscope A scanning probe microscope that analyzes the surface of a specimen by recording the intensity of light as it is focused through a pipette and raster scanned across the specimen at a distance less than a wavelength. The resolution and high contrast...

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